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Statistical performance analysis and modeling techniques for nanometer VLSI designs / Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.

By: Contributor(s): Publication details: New York, NY : Springer, 2012.Description: xxix, 305 p. : ill. ; 24 cmISBN:
  • 9781461407874 (hbk.)
  • 1461407877 (hbk.)
Subject(s): DDC classification:
  • 621.395 SHE 2012
Holdings
Cover image Item type Current library Home library Collection Shelving location Shelf location Call number Materials specified Vol info Copy number Status Notes Date due Barcode Item holds Item hold queue priority Course reserves
Main Collection Taylor's Library-TU

Floor 4, Shelf 19 , Side 2, TierNo 5, BayNo 4

 621.395 SHE 2012 (Browse shelf(Opens below)) 1 Available SLASx,05000,03,CL 5000143079

Includes bibliographical references (pages 287-297) and index.