Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
Series: Selected topics in electronics and systems ; v. 23.Publication details: [River Edge, NJ] : World Scientific, c2002.Description: ix, 270 p. : ill. ; 26 cmSubject(s): Genre/Form: DDC classification:- 621.39/732 21
- TK7871.99.M44 O95 2002eb
| Cover image | Item type | Current library | Home library | Collection | Shelving location | Shelf location | Call number | Materials specified | Vol info | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| E-Book | Taylor's Library-TU | 621.39/732 (Browse shelf(Opens below)) | e-book |
Includes bibliographical references.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.