Statistical performance analysis and modeling techniques for nanometer VLSI designs / Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.
By: Shen, Ruijing
.
Contributor(s): Tan, Sheldon X. D | Yu, Hao.
Publisher: New York, NY : Springer, 2012Description: xxix, 305 p. : ill. ; 24 cm.ISBN: 9781461407874 (hbk.); 1461407877 (hbk.).Subject(s): Integrated circuits -- Very large scale integration -- Computer-aided design | Integrated circuits -- Very large scale integration -- Statistical methods | Nanoelectronics -- Statistical methods | AlgorithmsDDC classification: 621.395
| Item type | Current location | Shelf location | Call number | Copy number | Status | Notes | Date due | Barcode |
|---|---|---|---|---|---|---|---|---|
| Main Collection | Taylor's Library-TU |
Floor 4, Shelf 19 , Side 2, TierNo 5, BayNo 4 |
621.395 SHE 2012 (Browse shelf) | 1 | Available | SLASx,05000,03,CL | 5000143079 |
Browsing Taylor's Library-TU Shelves Close shelf browser
| 621.395 ROT Fundamentals of logic design / | 621.395 SAR An introduction to VLSI physical design / | 621.395 SHA Logic circuits design / | 621.395 SHE 2012 Statistical performance analysis and modeling techniques for nanometer VLSI designs / | 621.395 SMI Application-specific integrated circuits / | 621.395 STO Digital logic techniques : | 621.395 STO Digital logic techniques : |
Includes bibliographical references (pages 287-297) and index.