Characterisation and control of defects in semiconductors/ Filip Tuomisto [Ed].
Contributor(s): Tuomisto, Filip [ed.].
Series: Materials, Circuits & Devices: Publisher: Stevenage : IET, 2019Description: 1 online resource (596 pages).Content type: text Media type: computer Carrier type: online resourceISBN: 9781785616563.Subject(s): Ion implantation | Magnetic resonance | Semiconductor doping | Semiconductors -- Materials | SiliconGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view| Item type | Current location | Call number | Status | Notes | Date due | Barcode |
|---|---|---|---|---|---|---|
| Main Collection | Taylor's Library - Perpetual(TU) | e-book | SOExx,92607,03,CL,PPT|SOExx,92606,03,CL,PPT|SOExx,92608,03,CL,PPT |