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Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross.

Contributor(s): Ross, Richard J | ebrary, Inc.
Publisher: Materials Park, Ohio : ASM International, c2011Edition: 6th ed.Description: xi, 660 p. : ill.Subject(s): Electronics -- Materials -- Testing -- Handbooks, manuals, etc | Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc | Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc | Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc | Semiconductors -- Defects -- Handbooks, manuals, etcGenre/Form: Electronic books. DDC classification: 621.381 Online resources: An electronic book accessible through the World Wide Web; click to view
Contents:
section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
Item type Current location Call number Status Date due Barcode
621.381 (Browse shelf) Available

Includes bibliographical references and indexes.

section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.

Electronic reproduction. Palo Alto, Calif. : ebrary, 2011. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.