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Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing / Jack W. Ekin.

By: Ekin, J. W.
Publisher: Oxford Oxford University Press, 2006Description: xxviii, 673 p. : ill. ; 26 cm.ISBN: 0198570546 (hbk.); 9780198570547 (hbk.).Subject(s): Low temperatures -- Measurement | Low temperatures -- Instruments | Low temperature research | SuperconductorsDDC classification: 536.54
Contents:
Part I. Cryostat Design and Materials Selection. 1. Introduction to Measurement Cryostats and Cooling Methods. 2. Heat Transfer at Cryogenic Temperatures. 3. Cryostat Construction. 4. Wiring and Connections. 5. Temperature Measurement and Control. 6. Properties of Solids at Low Temperatures. - Part II. Electrical Transport Measurements: Sample Holders and Contacts. 7. Sample Holders. 8. Sample Contacts. - Part III. Superconductor Critical-Current Measurements and Data Analysis. 9. Critical-Current Measurements. 10. Critical-Current Data Analysis. - Appendixes.
Item type Current location Call number Copy number Status Notes Date due Barcode Remark
Main Collection TU External Storage-LCS
536.54 EKI (Browse shelf) 1 Available SOExx,07015,03,GR 5000052214 Please fill up online form at https://taylorslibrary.taylors.edu.my/services/external_storage1

Includes bibliographical references and index.

Part I. Cryostat Design and Materials Selection. 1. Introduction to Measurement Cryostats and Cooling Methods. 2. Heat Transfer at Cryogenic Temperatures. 3. Cryostat Construction. 4. Wiring and Connections. 5. Temperature Measurement and Control. 6. Properties of Solids at Low Temperatures. - Part II. Electrical Transport Measurements: Sample Holders and Contacts. 7. Sample Holders. 8. Sample Contacts. - Part III. Superconductor Critical-Current Measurements and Data Analysis. 9. Critical-Current Measurements. 10. Critical-Current Data Analysis. - Appendixes.