World class reliability [electronic resource] : using Multiple Environment Overstress Tests to make it happen / Keki R. Bhote and Adi K. Bhote.
By: Bhote, Keki R
.
Contributor(s): Bhote, Adi K | ebrary, Inc.
Publisher: New York : American Management Association, 2004Description: xix, 218 p.Subject(s): Reliability (Engineering) | EngineeringGenre/Form: Electronic books. DDC classification: 620/.00452 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 620/.00452 (Browse shelf) | Available |
Includes bibliographical references and index.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.