Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.
Contributor(s): Nadeau-Dostie, Benoit
| ebrary, Inc.
Series: Frontiers in electronic testing: Publisher: Boston : Kluwer Academic, c2000Description: xvii, 239 p. : ill. ; 26 cm.Subject(s): Integrated circuits -- Testing | Electronic apparatus and appliances -- TestingGenre/Form: Electronic books. DDC classification: 621.385 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 621.385 (Browse shelf) | Available |
Includes bibliographical references.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.