ISTFA 2008 [electronic resource] : conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.
By: (34th : International Symposium for Testing and Failure Analysis (34th : 2008 : Portland, Or.).
Contributor(s): ASM International
| Electronic Device Failure Analysis Society | ebrary, Inc.
Publisher: Materials Park, OH : ASM International, c2008Description: xx, 528 p. : ill.Other title: Proceedings of the 34th International Symposium for Testing and Failure Analysis | 34th International Symposium for Testing and Failure Analysis | Thirty-fourth International Symposium for Testing and Failure Analysis.Subject(s): Electronics -- Materials -- Testing -- Congresses | Electronic apparatus and appliances -- Testing -- CongressesGenre/Form: Electronic books.Online resources: An electronic book accessible through the World Wide Web; click to view
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Includes bibliographical references and index.
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Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.