Electron microscopy and analysis [electronic resource] / Peter J. Goodhew, John Humphreys, Richard Beanland.
By: Goodhew, Peter J.
Contributor(s): Beanland, R | Humphreys, F. J | ebrary, Inc
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Publisher: London : Taylor & Francis, 2001Edition: 3rd ed.Description: xi, 251 p. : ill. ; 24 cm.Subject(s): Electron microscopyGenre/Form: Electronic books.DDC classification: 502.825 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 502.825 (Browse shelf) | Available |
Previous ed.: 1988.
Includes bibliographical references and index.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2005. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.