VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Contributor(s): Wang, Laung-Terng
| Wu, Cheng-Wen, EE Ph. D | Wen, Xiaoqing.
Series: Morgan Kaufmann series in systems on silicon: Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Description: xxx, 777 p. : ill. ; 25 cm.Subject(s): Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- DesignGenre/Form: Electronic books.DDC classification: 621.39/5 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 621.39/5 (Browse shelf) | Available |
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.