System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
Contributor(s): Wang, Laung-Terng
| Stroud, Charles E | Touba, Nur A | ebrary, Inc.
Series: Morgan Kaufmann series in systems on silicon: Publisher: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008Description: xxxvi, 856 p. : ill. ; 25 cm.Subject(s): Systems on a chip -- Testing | Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- DesignGenre/Form: Electronic books.DDC classification: 621.39/5 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 621.39/5 (Browse shelf) | Available |
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Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.