High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams.
By: Adams, R. Dean.
Contributor(s): ebrary, Inc
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Series: Frontiers in electronic testing: Publisher: Boston : Kluwer Academic, c2003Description: xiii, 246 p. : ill. ; 25 cm.Subject(s): Semiconductor storage devices -- Testing | Computer storage devices -- TestingGenre/Form: Electronic books.DDC classification: 621.39/732 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 621.39/732 (Browse shelf) | Available |
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Includes bibliographical references (p. [229]-239) and index.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.