Power-constrained testing of VLSI circuits [electronic resource] / by Nicola Nicolici and Bashir M. Al-Hashimi.
By: Nicolici, Nicola.
Contributor(s): Al-Hashimi, Bashir | ebrary, Inc
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Series: Frontiers in electronic testing: 22.Publisher: Boston : Kluwer Academic Publishers, c2003Description: xi, 178 p. : ill. ; 25 cm.Subject(s): Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- Protection | Semiconductors -- Thermal propertiesGenre/Form: Electronic books.DDC classification: 621.39/5/0287 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 621.39/5/0287 (Browse shelf) | Available |
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Includes bibliographical references (p. 163-173) and index.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.