Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
Contributor(s): Dumin, D. J | ebrary, Inc
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Series: Selected topics in electronics and systems: v. 23.Publisher: [River Edge, NJ] : World Scientific, c2002Description: ix, 270 p. : ill. ; 26 cm.Subject(s): Metal oxide semiconductors -- Reliability | Silicon oxide -- DeteriorationGenre/Form: Electronic books.DDC classification: 621.39/732 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 621.39/732 (Browse shelf) | Available |
Includes bibliographical references.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.