Sousa, Jose T. de. <br/><br/>
Boundary-scan interconnect diagnosis  [electronic resource] / 
José T. de Sousa, Peter Y.K. Cheung. 
 - Boston :  Kluwer Academic Publishers,  c2001. 
 - xxi, 168 p. :  ill. ;  25 cm. 
 - Frontiers in electronic testing ;  18 .
 - Frontiers in electronic testing ;  18. .
<br/><br/>Includes bibliographical references (p. 145-150) and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Boundary scan testing.<br/>Electronic apparatus and appliances--Testing.<br/>Electronic packaging.<br/>Electric contacts--Testing.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7870.23  / .S64 2001eb 
<br/><br/><label>Dewey Class. No.: </label>621.381