Aberration-corrected analytical transmission electron microscopy  [electronic resource] / 
edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks. 
 - Hoboken, N.J. :  Wiley,  2011. 
 - xv, 280 p., [8] leaves of plates :  ill. (some col.) 
<br/><br/>Includes bibliographical references and index. 
<br/><br/> "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--  "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2011. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
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<br/><br/><label>Subjects--Topical Terms: </label><br/>Transmission electron microscopy.<br/>Aberration.<br/>Achromatism.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH212.T7  / A24 2011eb