Shen, Ruijing. <br/><br/>
Statistical performance analysis and modeling techniques for nanometer VLSI designs / 
Ruijing Shen, Sheldon X.-D. Tan, Hao Yu. 
 - New York, NY :  Springer,  2012. 
 - xxix, 305 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references (pages 287-297) and index. 
<br/><br/><label>ISBN: </label>9781461407874 (hbk.) 1461407877 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Very large scale integration--Computer-aided design.<br/>Integrated circuits--Very large scale integration--Statistical methods.<br/>Nanoelectronics--Statistical methods.<br/>Algorithms.
<br/><br/><label>Dewey Class. No.: </label>621.395  / SHE 2012