TY  - BOOK
AU  - Shen,Ruijing
AU  - Tan,Sheldon X.D.
AU  - Yu,Hao
TI  - Statistical performance analysis and modeling techniques for nanometer VLSI designs
SN  - 9781461407874 (hbk.)
U1  - 621.395 
PY  - 2012///
CY  - New York, NY
PB  - Springer
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Computer-aided design
KW  - Statistical methods
KW  - Nanoelectronics
KW  - Algorithms
N1  - Includes bibliographical references (pages 287-297) and index
ER  -