TY  - BOOK
AU  - Yablon,Dalia G.
TI  - Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization
SN  - 1118723147 (electronic bk.)
U1  - 620.1 
PY  - 2014///
CY  - Hoboken, New Jersey
PB  - Wiley
KW  - Materials
KW  - Microscopy
KW  - Scanning probe microscopy
KW  - Industrial applications
KW  - Electronic books
UR  - https://ezproxy.taylors.edu.my/login?url=http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=653909
ER  -