Microelectronics failure analysis  desk reference /  [electronic resource] : 
edited by Richard J. Ross. 
 - 6th ed. 
 - Materials Park, Ohio :  ASM International,  c2011. 
 - xi, 660 p. :  ill. 
<br/><br/>Includes bibliographical references and indexes. 
<br/><br/>section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2011. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronics--Materials--Testing--Handbooks, manuals, etc.<br/>Microelectronics--Materials--Testing--Handbooks, manuals, etc.<br/>Microelectronics--Materials--Defects--Handbooks, manuals, etc.<br/>Electronic apparatus and appliances--Testing--Handbooks, manuals, etc.<br/>Semiconductors--Defects--Handbooks, manuals, etc.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7871  / .M52 2011eb 
<br/><br/><label>Dewey Class. No.: </label>621.381