TY  - BOOK
AU  - Ross,Richard J.
ED  - ebrary, Inc.
TI  - Microelectronics failure analysis: desk reference 
AV  - TK7871 .M52 2011eb
U1  - 621.381 23
PY  - 2011///
CY  - Materials Park, Ohio
PB  - ASM International
KW  - Electronics
KW  - Materials
KW  - Testing
KW  - Handbooks, manuals, etc
KW  - Microelectronics
KW  - Defects
KW  - Electronic apparatus and appliances
KW  - Semiconductors
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and indexes; section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information; Electronic reproduction; Palo Alto, Calif.; ebrary; 2011; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10540838
ER  -