Freund, L. B. <br/><br/>
Thin film materials  stress, defect formation, and surface evolution /  [electronic resource] : 
L.B. Freund, S. Suresh. 
 - Cambridge, UK ;  New York :  Cambridge University Press,  2003. 
 - xviii, 750 p. :  ill. 
<br/><br/>Includes bibliographical references (p. 713-737) and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
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<br/><br/><label>Subjects--Topical Terms: </label><br/>Thin films.<br/>Surfaces (Technology)
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TA418.9.T45  / F74 2003eb 
<br/><br/><label>Dewey Class. No.: </label>621.3815/2