Beam effects, surface topography, and depth profiling in surface analysis  [electronic resource] / 
edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell. 
 - New York :  Plenum Press,  c1998. 
 - xix, 430 p. :  ill. ;  24 cm. 
 - Methods of surface characterization ;  v. 5 .
 - Methods of surface characterization ;  v. 5. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Surfaces (Technology)--Analysis.<br/>Materials--Effect of radiation on.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TA418.7  / .B43 1998eb 
<br/><br/><label>Dewey Class. No.: </label>620/.44