Microwave electronics measurement and materials characterisation / [electronic resource] :
L. F. Chen ... [et al.].
- Chichester : John Wiley, c2004.
- xiii, 537 p. : ill. ; 26 cm.
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.