Design for at-speed test, diagnosis, and measurement  [electronic resource] / 
edited by Benoit Nadeau-Dostie. 
 - Boston :  Kluwer Academic,  c2000. 
 - xvii, 239 p. :  ill. ;  26 cm. 
 - Frontiers in electronic testing .
 - Frontiers in electronic testing. .
<br/><br/>Includes bibliographical references. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--Testing.<br/>Electronic apparatus and appliances--Testing.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7874  / .D47497 2000eb 
<br/><br/><label>Dewey Class. No.: </label>621.385