TY  - BOOK
AU  - Nadeau-Dostie,Benoit
ED  - ebrary, Inc.
TI  - Design for at-speed test, diagnosis, and measurement
T2  - Frontiers in electronic testing
AV  - TK7874 .D47497 2000eb
U1  - 621.385 21
PY  - 2000///
CY  - Boston
PB  - Kluwer Academic
KW  - Integrated circuits
KW  - Testing
KW  - Electronic apparatus and appliances
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10052637
ER  -