Sas, Miryam. <br/><br/>
Fault lines  cultural memory and Japanese surrealism /  [electronic resource] : 
Miryam Sas. 
 - Stanford, Calif. :  Stanford University Press,  c1999. 
 - xiv, 250 p. :  ill. ;  24 cm. 
 - Cultural memory in the present .
 - Cultural memory in the present. .
<br/><br/>Includes bibliographical references (p. [229]-239) and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>LCCN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Japanese literature--History and criticism.--1868-<br/>Surrealism (Literature)--Japan.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>PL726.55  / .S269 1999eb 
<br/><br/><label>Dewey Class. No.: </label>895.6/144091163