Kelly, Joe. <br/><br/>
Advanced production testing of RF, SoC, and SiP devices  [electronic resource] / 
Joe Kelly, Michael Engelhardt. 
 - Boston :  Artech House,  2007. 
 - xx, 301 p. :  ill. 
 - Artech House microwave library .
 - Artech House microwave library. .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label>
<br/><br/><label>Subjects--Topical Terms: </label><br/>Systems on a chip--Testing.<br/>Embedded computer systems.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7895.E42  / K49 2007eb