Goodhew, Peter J. <br/><br/>
Electron microscopy and analysis  [electronic resource] / 
Peter J. Goodhew, John Humphreys, Richard Beanland. 
 - 3rd ed. 
 - London :  Taylor & Francis,  2001. 
 - xi, 251 p. :  ill. ;  24 cm. 
<br/><br/> Previous ed.: 1988. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2005. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
<br/><br/><label>ISBN: </label> No price 
<br/><br/><label>LCCN: </label>
<br/><br/><label>Nat. Bib. No.: </label>GBA1-43398 
<br/><br/><label>Nat. Bib. Agency Control No.: </label>0748409688  Uk 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QH212.E4  / G62 2001eb 
<br/><br/><label>Dewey Class. No.: </label>502.825