TY  - BOOK
AU  - Wang,Laung-Terng
AU  - Wu,Cheng-Wen
AU  - Wen,Xiaoqing
TI  - VLSI test principles and architectures: design for testability 
T2  - The Morgan Kaufmann series in systems on silicon
AV  - TK7874.75 .V587 2006eb
U1  - 621.39/5 22
PY  - 2006///
CY  - Amsterdam, Boston
PB  - Elsevier Morgan Kaufmann Publishers
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Design
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10169928
ER  -