Adams, R. Dean. <br/><br/>
High performance memory testing  design principles, fault modeling, and self-test /  [electronic resource] : 
R. Dean Adams. 
 - Boston :  Kluwer Academic,  c2003. 
 - xiii, 246 p. :  ill. ;  25 cm. 
 - Frontiers in electronic testing .
 - Frontiers in electronic testing. .
<br/><br/>Includes bibliographical references (p. [229]-239) and index. 
<br/><br/><br/>Electronic reproduction. <br/>Palo Alto, Calif. : <br/>ebrary, <br/>2009. <br/>Available via World Wide Web. <br/>Access may be limited to ebrary affiliated libraries. 
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<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor storage devices--Testing.<br/>Computer storage devices--Testing.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7895.M4  / A27 2003eb 
<br/><br/><label>Dewey Class. No.: </label>621.39/732