TY  - BOOK
AU  - Adams,R.Dean
ED  - ebrary, Inc.
TI  - High performance memory testing: design principles, fault modeling, and self-test 
T2  - Frontiers in electronic testing
AV  - TK7895.M4 A27 2003eb
U1  - 621.39/732 21
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic
KW  - Semiconductor storage devices
KW  - Testing
KW  - Computer storage devices
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references (p. [229]-239) and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10067254
ER  -