TY  - BOOK
AU  - Nicolici,Nicola
AU  - Al-Hashimi,Bashir
ED  - ebrary, Inc.
TI  - Power-constrained testing of VLSI circuits
T2  - Frontiers in electronic testing
AV  - TK7874.75 .N53 2003eb
U1  - 621.39/5/0287 21
PY  - 2003///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Protection
KW  - Semiconductors
KW  - Thermal properties
KW  - Electronic books
KW  - local
N1  - Includes bibliographical references (p. 163-173) and index; Electronic reproduction; Palo Alto, Calif.; ebrary; 2009; Available via World Wide Web; Access may be limited to ebrary affiliated libraries
UR  - http://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10066763
ER  -