Fundamentals of forensic science [electronic resource] /
Max Houck, Jay Siegel.
- Amsterdam ; Boston : Elsevier/Academic Press, c2006.
- xv, 672 p. : ill. (some col.)
Includes bibliographical references and index.
Electronic reproduction. Palo Alto, Calif. : ebrary, 2010. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.