Beam effects, surface topography, and depth profiling in surface analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.
Contributor(s): Czanderna, Alvin Warren
| Madey, Theodore E | Powell, C. J. (Cedric John) | ebrary, Inc.
Series: Methods of surface characterization: v. 5.Publisher: New York : Plenum Press, c1998Description: xix, 430 p. : ill. ; 24 cm.Subject(s): Surfaces (Technology) -- Analysis | Materials -- Effect of radiation onGenre/Form: Electronic books. DDC classification: 620/.44 Online resources: An electronic book accessible through the World Wide Web; click to view
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| 620/.44 (Browse shelf) | Available |
Includes bibliographical references and index.
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Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.