Design for at-speed test, diagnosis, and measurement [electronic resource] / edited by Benoit Nadeau-Dostie.
Contributor(s): Nadeau-Dostie, Benoit
| ebrary, Inc
.
Series: Frontiers in electronic testing: Publisher: Boston : Kluwer Academic, c2000Description: xvii, 239 p. : ill. ; 26 cm.Subject(s): Integrated circuits -- Testing![](/opac-tmpl/bootstrap/images/filefind.png)
![](/opac-tmpl/bootstrap/images/filefind.png)
![](/opac-tmpl/bootstrap/images/filefind.png)
Item type | Current location | Call number | Status | Date due | Barcode |
---|---|---|---|---|---|
621.385 (Browse shelf) | Available |
Includes bibliographical references.
TSLHHL
Electronic reproduction. Palo Alto, Calif. : ebrary, 2009. Available via World Wide Web. Access may be limited to ebrary affiliated libraries.