Your search returned 2 results.

Not what you expected? Check for suggestions
|
A designer's guide to built-in self-test [electronic resource] / Charles E. Stroud.

by Stroud, Charles E | ebrary, Inc.

Publisher: Boston : Kluwer Academic Publishers, c2002Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.381] (1).
System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.

by Wang, Laung-Terng | Stroud, Charles E | Touba, Nur A | ebrary, Inc.

Publisher: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for loan: [Call number: 621.39/5] (1).