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		Scanning Probe Microscopy for Industrial Applications [electronic resource] : Nanomechanical Characterization. by Yablon, Dalia G. Publisher: Hoboken, New Jersey : Wiley, 2014Online access: An electronic book accessible through the World Wide Web; click to view Availability: Items available for reference: Taylor's Library-TU [Call number: 620.1 23] (1).

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