| 000 | 01065cam a2200277 a 4500 | ||
|---|---|---|---|
| 001 | vtls003252706 | ||
| 003 | MY-SjTCS | ||
| 005 | 20200226115852.0 | ||
| 008 | 130617s2012 nyua b 001 0 eng | ||
| 020 | _a9781461407874 (hbk.) | ||
| 020 | _a1461407877 (hbk.) | ||
| 039 | 9 |
_a201308221357 _bpushpa _y201306170921 _zmalathy |
|
| 082 | 0 | 4 |
_a621.395 _bSHE 2012 |
| 100 | 1 |
_aShen, Ruijing. _968917 |
|
| 245 | 1 | 0 |
_aStatistical performance analysis and modeling techniques for nanometer VLSI designs / _cRuijing Shen, Sheldon X.-D. Tan, Hao Yu. |
| 260 |
_aNew York, NY : _bSpringer, _c2012. |
||
| 300 |
_axxix, 305 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references (pages 287-297) and index. | ||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xComputer-aided design. |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xStatistical methods. |
|
| 650 | 0 |
_aNanoelectronics _xStatistical methods. |
|
| 650 | 0 | _aAlgorithms. | |
| 700 | 1 |
_aTan, Sheldon X. D. _968918 |
|
| 700 | 1 | _aYu, Hao. | |
| 920 | _aADTP : 200036 | ||
| 999 |
_c155222 _d155222 |
||