000 01351nam a2200361 a 4500
001 vtls003230768
003 MY-SjTCS
005 20200226120059.0
008 120423s2012 nyua b 001 0 eng d
020 _a9780071317061 (paperback)
020 _a0071317066 (paperback)
020 _a9780073529578 (hardback)
020 _a0073529575 (hardback)
039 9 _a201910071716
_bAUTHORITY
_c201910071716
_dAUTHORITY
_c201809071418
_dVLOAD
_c201504111209
_dpushpa
_y201204231146
_zstazrina
040 _erda
082 0 4 _a621.3192
_bHAY 2012
100 1 _aHayt, William H.
_q(William Hart),
_cJr.,
_d1920-1999
245 1 0 _aEngineering circuit analysis /
_cWilliam H. Hayt, Jr., Jack E. Kemmerly, Steven M. Durbin.
250 _aEighth edition, International edition
264 1 _aNew York, NY :
_bMcGraw-Hill,
_c[2012]
264 4 _c©2012
300 _axxi, 852 pages :
_billustrations (some colour) ;
_c26 cm
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
504 _aIncludes bibliographical references and index.
650 0 _aElectric circuit analysis.
_9589
650 0 _aElectric network analysis.
_97913
700 1 _aKemmerly, Jack E.
_q(Jack Ellsworth),
_d1924-1998
_993508
700 1 _aDurbin, Steven M.
_913142
920 _aADTP : 189970
921 _aENG : 214420, 214421
999 _c158593
_d158593