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008 141205s2014 nju o 000 0 eng d
020 _a1118723147 (electronic bk.)
020 _a9781118723142 (electronic bk.)
020 _z1118288238
020 _z9781118288238
020 _z9781306072960
020 _z1306072964
035 _a(OCoLC)868954409
035 _aocn868954409
039 9 _y201412051448
_zshuhada
040 _aCDX
_beng
_epn
_cCDX
_dE7B
_dOCLCQ
_dOCLCO
_dN$T
_dUKDOC
082 0 4 _a620.1
_b23
100 1 _aYablon, Dalia G.
245 1 0 _aScanning Probe Microscopy for Industrial Applications
_h[electronic resource] :
_bNanomechanical Characterization.
260 _aHoboken, New Jersey :
_bWiley,
_c2014.
300 _a1 online resource (1 online resource (pages cm))
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
588 _aDescription based on print version record.
650 0 _aMaterials
_xMicroscopy.
650 0 _aScanning probe microscopy
_xIndustrial applications.
655 4 _aElectronic books.
776 0 8 _iPrint version:
_z9781306072960
856 4 0 _uhttps://ezproxy.taylors.edu.my/login?url=http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=653909
_zAn electronic book accessible through the World Wide Web; click to view
999 _c159581
_d159581