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| 010 | _z 99-046022 | ||
| 020 | _z0792386698 (alk. paper) | ||
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_aDesign for at-speed test, diagnosis, and measurement _h[electronic resource] / _cedited by Benoit Nadeau-Dostie. |
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_aBoston : _bKluwer Academic, _cc2000. |
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| 300 |
_axvii, 239 p. : _bill. ; _c26 cm. |
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| 490 | 1 | _aFrontiers in electronic testing | |
| 504 | _aIncludes bibliographical references. | ||
| 529 | _aTSLHHL | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
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_aIntegrated circuits _xTesting. _9294081 |
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| 650 | 0 |
_aElectronic apparatus and appliances _xTesting. _9294082 |
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_aElectronic books. _2local _9201578 |
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| 700 | 1 |
_aNadeau-Dostie, Benoit. _9294083 |
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_aebrary, Inc. _925628 |
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_aFrontiers in electronic testing. _9294084 |
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_uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10052637 _zAn electronic book accessible through the World Wide Web; click to view |
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