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050	1	4	_aTK7871 _b.I68 2008eb
111	2		_aInternational Symposium for Testing and Failure Analysis _n(34th : _d2008 : _cPortland, Or.)
245	1	0	_aISTFA 2008 _h[electronic resource] : _bconference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / _csponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International.
246	3	0	_aProceedings of the 34th International Symposium for Testing and Failure Analysis
246	3	0	_a34th International Symposium for Testing and Failure Analysis
246	3		_aThirty-fourth International Symposium for Testing and Failure Analysis
260			_aMaterials Park, OH : _bASM International, _cc2008.
300			_axx, 528 p. : _bill.
504			_aIncludes bibliographical references and index.
529			_aTSLHHL
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aElectronics _xMaterials _xTesting _vCongresses.
650		0	_aElectronic apparatus and appliances _xTesting _vCongresses.
655		7	_aElectronic books. _2local
710	2		_aASM International. _920103
710	2		_aElectronic Device Failure Analysis Society.
710	2		_aebrary, Inc. _925628
856	4	0	_uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10320212 _zAn electronic book accessible through the World Wide Web; click to view
999			_c76401 _d76401