000 01451nam a2200373Ia 4500
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006 m u
007 cr cn|||||||||
008 100712s2007 maua sb 001 0 eng d
020 _z158053709X
020 _z9781580537094
020 _z9781580537100
035 _a(CaPaEBR)ebr10221935
039 9 _y201007121525
_zVLOAD
040 _aCaPaEBR
_cCaPaEBR
050 1 4 _aTK7895.E42
_bK49 2007eb
100 1 _aKelly, Joe.
245 1 0 _aAdvanced production testing of RF, SoC, and SiP devices
_h[electronic resource] /
_cJoe Kelly, Michael Engelhardt.
260 _aBoston :
_bArtech House,
_c2007.
300 _axx, 301 p. :
_bill.
490 1 _aArtech House microwave library
504 _aIncludes bibliographical references and index.
529 _aTSLHHL
533 _aElectronic reproduction.
_bPalo Alto, Calif. :
_cebrary,
_d2009.
_nAvailable via World Wide Web.
_nAccess may be limited to ebrary affiliated libraries.
650 0 _aSystems on a chip
_xTesting.
650 0 _aEmbedded computer systems.
655 7 _aElectronic books.
_2local
700 1 _aEngelhardt, M.
_q(Michael)
710 2 _aebrary, Inc.
_925628
830 0 _aArtech House microwave library.
856 4 0 _uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10221935
_zAn electronic book accessible through the World Wide Web; click to view
999 _c81739
_d81739