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_a502.825 _221 |
| 100 | 1 | _aGoodhew, Peter J. | |
| 245 | 1 | 0 |
_aElectron microscopy and analysis _h[electronic resource] / _cPeter J. Goodhew, John Humphreys, Richard Beanland. |
| 250 | _a3rd ed. | ||
| 260 |
_aLondon : _bTaylor & Francis, _c2001. |
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| 300 |
_axi, 251 p. : _bill. ; _c24 cm. |
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| 500 | _aPrevious ed.: 1988. | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 529 | _aTSLHHL | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2005. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aElectron microscopy. _927913 |
|
| 655 | 7 |
_aElectronic books. _2local |
|
| 700 | 1 | _aBeanland, R. | |
| 700 | 1 | _aHumphreys, F. J. | |
| 710 | 2 |
_aebrary, Inc. _925628 |
|
| 856 | 4 | 0 |
_uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10017829 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c84569 _d84569 |
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