| 000 | 01710nam a22003854a 4500 | ||
|---|---|---|---|
| 001 | vtls003236254 | ||
| 003 | MY-SjTCS | ||
| 005 | 20200226112028.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 120815s2006 ne a sb 001 0 eng | ||
| 010 | _z2006-006869 | ||
| 020 | _z0123705975 (hardcover : alk. paper) | ||
| 020 | _z9780123705976 | ||
| 035 | _a(OCoLC)648178245 | ||
| 035 | _a(CaPaEBR)ebr10169928 | ||
| 039 | 9 |
_y201208151701 _zwilmina |
|
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 050 | 1 | 4 |
_aTK7874.75 _b.V587 2006eb |
| 082 | 0 | 4 |
_a621.39/5 _222 |
| 245 | 0 | 0 |
_aVLSI test principles and architectures _h[electronic resource] : _bdesign for testability / _cedited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. |
| 260 |
_aAmsterdam ; _aBoston : _bElsevier Morgan Kaufmann Publishers, _cc2006. |
||
| 300 |
_axxx, 777 p. : _bill. ; _c25 cm. |
||
| 490 | 1 | _aThe Morgan Kaufmann series in systems on silicon | |
| 504 | _aIncludes bibliographical references and index. | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xDesign. |
|
| 655 | 7 |
_aElectronic books. _2local |
|
| 700 | 1 |
_aWang, Laung-Terng. _949205 |
|
| 700 | 1 |
_aWu, Cheng-Wen, _cEE Ph. D. |
|
| 700 | 1 | _aWen, Xiaoqing. | |
| 830 | 0 |
_aMorgan Kaufmann series in systems on silicon. _949208 |
|
| 856 | 4 | 0 |
_uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10169928 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c88995 _d88995 |
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