000			01810nam a2200409 a 4500
001			vtls003236679
003			MY-SjTCS
005			20200226112028.0
006			m u
007			cr cn|||||||||
008			120815s2008 ne a sb 001 0 eng
010			_z2007-023373
020			_z9780123739735 (hardcover : alk. paper)
020			_z012373973X (hardcover : alk. paper)
035			_a(OCoLC)647688301
035			_a(CaPaEBR)ebr10203465
039		9	_y201208151703 _zwilmina
040			_aCaPaEBR _cCaPaEBR
050	1	4	_aTK7895.E42 _bS978 2008eb
082	0	4	_a621.39/5 _222
245	0	0	_aSystem-on-chip test architectures _h[electronic resource] : _bnanometer design for testability / _cedited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
260			_aAmsterdam ; _aBoston : _bMorgan Kaufmann Publishers, _cc2008.
300			_axxxvi, 856 p. : _bill. ; _c25 cm.
490	1		_aThe Morgan Kaufmann series in systems on silicon
504			_aIncludes bibliographical references and index.
533			_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries.
650		0	_aSystems on a chip _xTesting.
650		0	_aIntegrated circuits _xVery large scale integration _xTesting.
650		0	_aIntegrated circuits _xVery large scale integration _xDesign.
655		7	_aElectronic books. _2local
700	1		_aWang, Laung-Terng. _949205
700	1		_aStroud, Charles E.
700	1		_aTouba, Nur A.
710	2		_aebrary, Inc. _925628
830		0	_aMorgan Kaufmann series in systems on silicon. _949208
856	4	0	_uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10203465 _zAn electronic book accessible through the World Wide Web; click to view
999			_c88998 _d88998