| 000 | 01491nam a22003614a 4500 | ||
|---|---|---|---|
| 001 | vtls003170499 | ||
| 003 | MY-SjTCS | ||
| 005 | 20200226112335.0 | ||
| 006 | m u | ||
| 007 | cr cn||||||||| | ||
| 008 | 100712s2003 maua sb 001 0 eng | ||
| 010 | _z 2002-034049 | ||
| 020 | _z1402072554 (alk. paper) | ||
| 035 | _a(CaPaEBR)ebr10067254 | ||
| 039 | 9 |
_y201007121416 _zVLOAD |
|
| 040 |
_aCaPaEBR _cCaPaEBR |
||
| 050 | 1 | 4 |
_aTK7895.M4 _bA27 2003eb |
| 082 | 0 | 4 |
_a621.39/732 _221 |
| 100 | 1 | _aAdams, R. Dean. | |
| 245 | 1 | 0 |
_aHigh performance memory testing _h[electronic resource] : _bdesign principles, fault modeling, and self-test / _cR. Dean Adams. |
| 260 |
_aBoston : _bKluwer Academic, _cc2003. |
||
| 300 |
_axiii, 246 p. : _bill. ; _c25 cm. |
||
| 490 | 1 | _aFrontiers in electronic testing | |
| 504 | _aIncludes bibliographical references (p. [229]-239) and index. | ||
| 529 | _aTSLHHL | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
||
| 650 | 0 |
_aSemiconductor storage devices _xTesting. |
|
| 650 | 0 |
_aComputer storage devices _xTesting. |
|
| 655 | 7 |
_aElectronic books. _2local |
|
| 710 | 2 |
_aebrary, Inc. _925628 |
|
| 830 | 0 | _aFrontiers in electronic testing. | |
| 856 | 4 | 0 |
_uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10067254 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c93307 _d93307 |
||