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| 008 | 100712s2003 maua sb 001 0 eng | ||
| 010 | _z 2002-043306 | ||
| 020 | _z140207235X (alk. paper) | ||
| 035 | _a(CaPaEBR)ebr10066763 | ||
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_a621.39/5/0287 _221 |
| 100 | 1 | _aNicolici, Nicola. | |
| 245 | 1 | 0 |
_aPower-constrained testing of VLSI circuits _h[electronic resource] / _cby Nicola Nicolici and Bashir M. Al-Hashimi. |
| 260 |
_aBoston : _bKluwer Academic Publishers, _cc2003. |
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| 300 |
_axi, 178 p. : _bill. ; _c25 cm. |
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| 490 | 1 |
_aFrontiers in electronic testing ; _v22 |
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| 504 | _aIncludes bibliographical references (p. 163-173) and index. | ||
| 529 | _aTSLHHL | ||
| 533 |
_aElectronic reproduction. _bPalo Alto, Calif. : _cebrary, _d2009. _nAvailable via World Wide Web. _nAccess may be limited to ebrary affiliated libraries. |
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| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xTesting. |
|
| 650 | 0 |
_aIntegrated circuits _xVery large scale integration _xProtection. |
|
| 650 | 0 |
_aSemiconductors _xThermal properties. |
|
| 655 | 7 |
_aElectronic books. _2local |
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| 700 | 1 | _aAl-Hashimi, Bashir. | |
| 710 | 2 |
_aebrary, Inc. _925628 |
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| 830 | 0 |
_aFrontiers in electronic testing ; _v22. |
|
| 856 | 4 | 0 |
_uhttp://ezproxy.taylors.edu.my/login?url=http://site.ebrary.com/lib/taylorscollege/Doc?id=10066763 _zAn electronic book accessible through the World Wide Web; click to view |
| 999 |
_c93591 _d93591 |
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